ARL 9900 WS
Performs the analysis of samples by X-ray fluorescence and X-ray diffraction with independent systems, preserving the reliability of the results in a wide variety of materials (F to U).
It combines the analysis of samples by X-ray fluorescence and X-ray diffraction with an improved system. A great alternative for reliable results from a wide variety of materials (F to U).
Dedicated to the analysis of samples by X-ray fluorescence. It optimizes the analytical performance with technological improvements, reaching new limits of quantification in its different applications
The simplest alternative for analyzing samples by X-ray fluorescence by wavelength dispersion with reliable results in vacuum / helium environment. Ideal as backup instrument.
A desktop instrument, designed based on X-ray fluorescence by energy dispersion (ED-XRF), guaranteeing reliable results when performing analyzes in vacuum, air or mixed environment.